High spatial resolution semi‐automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes
Identifieur interne : 000B63 ( Main/Exploration ); précédent : 000B62; suivant : 000B64High spatial resolution semi‐automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes
Auteurs : P. Moeck [États-Unis] ; S. Rouvimov [États-Unis] ; E. F. Rauch [France] ; M. Véron [France] ; H. Kirmse [Allemagne] ; I. H Usler [Allemagne] ; W. Neumann [Allemagne] ; D. Bultreys [Belgique] ; Y. Maniette [Belgique] ; S. Nicolopoulos [Belgique]Source :
- Crystal Research and Technology [ 0232-1300 ] ; 2011-06.
English descriptors
- KwdEn :
Abstract
A semi‐automatic technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is described. It is based primarily on the projected reciprocal lattice geometry, but also utilizes the intensity of reflections that are extracted from precession‐enhanced electron diffraction spot patterns of polycrystalline materials and multi‐material composites. At the core of the method, experimental (precession‐enhanced) electron diffraction spot patterns are cross correlated with pre‐calculated templates for a set of model structures. The required hardware facilitates a scanning‐precession movement of the primary electron beam on the polycrystalline and/or multi‐material sample and can be interfaced to any newer or older mid‐voltage TEM. The software that goes with this hardware is so flexible in its intake of experimental data that it can also create crystallite orientation and phase maps of nanocrystals from the amplitude part of Fourier transforms of high resolution TEM images. Experimentally obtained crystallite orientation and phase maps are shown for a clausthalite nanocrystal powder sample, polycrystalline aluminum and copper films, fine‐grained palladium films, as well as MnAs crystallites that are partly embedded in a GaAs wafer. Comprehensive open‐access and commercial crystallographic databases that may provide reference data in support of the nanocrystal phase identification process of the software are briefly mentioned. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Url:
DOI: 10.1002/crat.201000676
Affiliations:
- Allemagne, Belgique, France, États-Unis
- Auvergne-Rhône-Alpes, Berlin, Rhône-Alpes, Région de Bruxelles-Capitale
- Berlin, Bruxelles, Saint Martin d'Hères
Links toward previous steps (curation, corpus...)
- to stream Istex, to step Corpus: 000478
- to stream Istex, to step Curation: 000478
- to stream Istex, to step Checkpoint: 000726
- to stream Main, to step Merge: 000B65
- to stream Main, to step Curation: 000B63
Le document en format XML
<record><TEI wicri:istexFullTextTei="biblStruct"><teiHeader><fileDesc><titleStmt><title xml:lang="en">High spatial resolution semi‐automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes</title>
<author><name sortKey="Moeck, P" sort="Moeck, P" uniqKey="Moeck P" first="P." last="Moeck">P. Moeck</name>
</author>
<author><name sortKey="Rouvimov, S" sort="Rouvimov, S" uniqKey="Rouvimov S" first="S." last="Rouvimov">S. Rouvimov</name>
</author>
<author><name sortKey="Rauch, E F" sort="Rauch, E F" uniqKey="Rauch E" first="E. F." last="Rauch">E. F. Rauch</name>
</author>
<author><name sortKey="Veron, M" sort="Veron, M" uniqKey="Veron M" first="M." last="Véron">M. Véron</name>
</author>
<author><name sortKey="Kirmse, H" sort="Kirmse, H" uniqKey="Kirmse H" first="H." last="Kirmse">H. Kirmse</name>
</author>
<author><name sortKey="H Usler, I" sort="H Usler, I" uniqKey="H Usler I" first="I." last="H Usler">I. H Usler</name>
</author>
<author><name sortKey="Neumann, W" sort="Neumann, W" uniqKey="Neumann W" first="W." last="Neumann">W. Neumann</name>
</author>
<author><name sortKey="Bultreys, D" sort="Bultreys, D" uniqKey="Bultreys D" first="D." last="Bultreys">D. Bultreys</name>
</author>
<author><name sortKey="Maniette, Y" sort="Maniette, Y" uniqKey="Maniette Y" first="Y." last="Maniette">Y. Maniette</name>
</author>
<author><name sortKey="Nicolopoulos, S" sort="Nicolopoulos, S" uniqKey="Nicolopoulos S" first="S." last="Nicolopoulos">S. Nicolopoulos</name>
</author>
</titleStmt>
<publicationStmt><idno type="wicri:source">ISTEX</idno>
<idno type="RBID">ISTEX:9898D5EDC465E9D2785BDA6812B14B3C0C981E55</idno>
<date when="2011" year="2011">2011</date>
<idno type="doi">10.1002/crat.201000676</idno>
<idno type="url">https://api.istex.fr/document/9898D5EDC465E9D2785BDA6812B14B3C0C981E55/fulltext/pdf</idno>
<idno type="wicri:Area/Istex/Corpus">000478</idno>
<idno type="wicri:Area/Istex/Curation">000478</idno>
<idno type="wicri:Area/Istex/Checkpoint">000726</idno>
<idno type="wicri:doubleKey">0232-1300:2011:Moeck P:high:spatial:resolution</idno>
<idno type="wicri:Area/Main/Merge">000B65</idno>
<idno type="wicri:Area/Main/Curation">000B63</idno>
<idno type="wicri:Area/Main/Exploration">000B63</idno>
</publicationStmt>
<sourceDesc><biblStruct><analytic><title level="a" type="main" xml:lang="en">High spatial resolution semi‐automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes</title>
<author><name sortKey="Moeck, P" sort="Moeck, P" uniqKey="Moeck P" first="P." last="Moeck">P. Moeck</name>
<affiliation wicri:level="1"><country xml:lang="fr">États-Unis</country>
<wicri:regionArea>Nano‐Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207‐0751, U.S.A. and Oregon Nanoscience and Microtechnologies Institute</wicri:regionArea>
<wicri:noRegion>U.S.A. and Oregon Nanoscience and Microtechnologies Institute</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Rouvimov, S" sort="Rouvimov, S" uniqKey="Rouvimov S" first="S." last="Rouvimov">S. Rouvimov</name>
<affiliation wicri:level="1"><country xml:lang="fr">États-Unis</country>
<wicri:regionArea>Nano‐Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207‐0751, U.S.A. and Oregon Nanoscience and Microtechnologies Institute</wicri:regionArea>
<wicri:noRegion>U.S.A. and Oregon Nanoscience and Microtechnologies Institute</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Rauch, E F" sort="Rauch, E F" uniqKey="Rauch E" first="E. F." last="Rauch">E. F. Rauch</name>
<affiliation wicri:level="3"><country xml:lang="fr">France</country>
<wicri:regionArea>SIMAP/GPM2 Laboratory, CNRS‐Grenoble INP, 101 rue de la Physique BP 46, 38402 Saint Martin d'Hères</wicri:regionArea>
<placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region>
<region type="old region" nuts="2">Rhône-Alpes</region>
<settlement type="city">Saint Martin d'Hères</settlement>
</placeName>
</affiliation>
</author>
<author><name sortKey="Veron, M" sort="Veron, M" uniqKey="Veron M" first="M." last="Véron">M. Véron</name>
<affiliation wicri:level="3"><country xml:lang="fr">France</country>
<wicri:regionArea>SIMAP Science et Ingénierie des Matériaux et Procédés Laboratory, CNRS‐Grenoble INP, 1130 rue de la Piscine, BP 75, 38402 Saint Martin d'Hères</wicri:regionArea>
<placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region>
<region type="old region" nuts="2">Rhône-Alpes</region>
<settlement type="city">Saint Martin d'Hères</settlement>
</placeName>
</affiliation>
</author>
<author><name sortKey="Kirmse, H" sort="Kirmse, H" uniqKey="Kirmse H" first="H." last="Kirmse">H. Kirmse</name>
<affiliation wicri:level="3"><country xml:lang="fr">Allemagne</country>
<wicri:regionArea>Institute of Physics, Humboldt University of Berlin, Newtonstraße 15, 12489 Berlin</wicri:regionArea>
<placeName><region type="land" nuts="3">Berlin</region>
<settlement type="city">Berlin</settlement>
</placeName>
</affiliation>
</author>
<author><name sortKey="H Usler, I" sort="H Usler, I" uniqKey="H Usler I" first="I." last="H Usler">I. H Usler</name>
<affiliation wicri:level="3"><country xml:lang="fr">Allemagne</country>
<wicri:regionArea>Institute of Physics, Humboldt University of Berlin, Newtonstraße 15, 12489 Berlin</wicri:regionArea>
<placeName><region type="land" nuts="3">Berlin</region>
<settlement type="city">Berlin</settlement>
</placeName>
</affiliation>
</author>
<author><name sortKey="Neumann, W" sort="Neumann, W" uniqKey="Neumann W" first="W." last="Neumann">W. Neumann</name>
<affiliation wicri:level="3"><country xml:lang="fr">Allemagne</country>
<wicri:regionArea>Institute of Physics, Humboldt University of Berlin, Newtonstraße 15, 12489 Berlin</wicri:regionArea>
<placeName><region type="land" nuts="3">Berlin</region>
<settlement type="city">Berlin</settlement>
</placeName>
</affiliation>
</author>
<author><name sortKey="Bultreys, D" sort="Bultreys, D" uniqKey="Bultreys D" first="D." last="Bultreys">D. Bultreys</name>
<affiliation wicri:level="1"><country xml:lang="fr">Belgique</country>
<wicri:regionArea>NanoMEGAS SPRL, Boulevard Edmond Machterns No 79, Saint Jean Molenbeek, Brussels 1080</wicri:regionArea>
<placeName><settlement type="city">Bruxelles</settlement>
<region nuts="2">Région de Bruxelles-Capitale</region>
</placeName>
</affiliation>
</author>
<author><name sortKey="Maniette, Y" sort="Maniette, Y" uniqKey="Maniette Y" first="Y." last="Maniette">Y. Maniette</name>
<affiliation wicri:level="1"><country xml:lang="fr">Belgique</country>
<wicri:regionArea>NanoMEGAS SPRL, Boulevard Edmond Machterns No 79, Saint Jean Molenbeek, Brussels 1080</wicri:regionArea>
<placeName><settlement type="city">Bruxelles</settlement>
<region nuts="2">Région de Bruxelles-Capitale</region>
</placeName>
</affiliation>
</author>
<author><name sortKey="Nicolopoulos, S" sort="Nicolopoulos, S" uniqKey="Nicolopoulos S" first="S." last="Nicolopoulos">S. Nicolopoulos</name>
<affiliation wicri:level="1"><country xml:lang="fr">Belgique</country>
<wicri:regionArea>NanoMEGAS SPRL, Boulevard Edmond Machterns No 79, Saint Jean Molenbeek, Brussels 1080</wicri:regionArea>
<placeName><settlement type="city">Bruxelles</settlement>
<region nuts="2">Région de Bruxelles-Capitale</region>
</placeName>
</affiliation>
</author>
</analytic>
<monogr></monogr>
<series><title level="j">Crystal Research and Technology</title>
<title level="j" type="abbrev">Cryst. Res. Technol.</title>
<idno type="ISSN">0232-1300</idno>
<idno type="eISSN">1521-4079</idno>
<imprint><publisher>WILEY‐VCH Verlag</publisher>
<pubPlace>Berlin</pubPlace>
<date type="published" when="2011-06">2011-06</date>
<biblScope unit="volume">46</biblScope>
<biblScope unit="issue">6</biblScope>
<biblScope unit="page" from="589">589</biblScope>
<biblScope unit="page" to="606">606</biblScope>
</imprint>
<idno type="ISSN">0232-1300</idno>
</series>
<idno type="istex">9898D5EDC465E9D2785BDA6812B14B3C0C981E55</idno>
<idno type="DOI">10.1002/crat.201000676</idno>
<idno type="ArticleID">CRAT201000676</idno>
</biblStruct>
</sourceDesc>
<seriesStmt><idno type="ISSN">0232-1300</idno>
</seriesStmt>
</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>crystallite orientation</term>
<term>high resolution transmission electron microscopy</term>
<term>phase mapping</term>
<term>precession electron diffraction</term>
<term>structural characterization</term>
</keywords>
</textClass>
<langUsage><language ident="en">en</language>
</langUsage>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">A semi‐automatic technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is described. It is based primarily on the projected reciprocal lattice geometry, but also utilizes the intensity of reflections that are extracted from precession‐enhanced electron diffraction spot patterns of polycrystalline materials and multi‐material composites. At the core of the method, experimental (precession‐enhanced) electron diffraction spot patterns are cross correlated with pre‐calculated templates for a set of model structures. The required hardware facilitates a scanning‐precession movement of the primary electron beam on the polycrystalline and/or multi‐material sample and can be interfaced to any newer or older mid‐voltage TEM. The software that goes with this hardware is so flexible in its intake of experimental data that it can also create crystallite orientation and phase maps of nanocrystals from the amplitude part of Fourier transforms of high resolution TEM images. Experimentally obtained crystallite orientation and phase maps are shown for a clausthalite nanocrystal powder sample, polycrystalline aluminum and copper films, fine‐grained palladium films, as well as MnAs crystallites that are partly embedded in a GaAs wafer. Comprehensive open‐access and commercial crystallographic databases that may provide reference data in support of the nanocrystal phase identification process of the software are briefly mentioned. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</div>
</front>
</TEI>
<affiliations><list><country><li>Allemagne</li>
<li>Belgique</li>
<li>France</li>
<li>États-Unis</li>
</country>
<region><li>Auvergne-Rhône-Alpes</li>
<li>Berlin</li>
<li>Rhône-Alpes</li>
<li>Région de Bruxelles-Capitale</li>
</region>
<settlement><li>Berlin</li>
<li>Bruxelles</li>
<li>Saint Martin d'Hères</li>
</settlement>
</list>
<tree><country name="États-Unis"><noRegion><name sortKey="Moeck, P" sort="Moeck, P" uniqKey="Moeck P" first="P." last="Moeck">P. Moeck</name>
</noRegion>
<name sortKey="Rouvimov, S" sort="Rouvimov, S" uniqKey="Rouvimov S" first="S." last="Rouvimov">S. Rouvimov</name>
</country>
<country name="France"><region name="Auvergne-Rhône-Alpes"><name sortKey="Rauch, E F" sort="Rauch, E F" uniqKey="Rauch E" first="E. F." last="Rauch">E. F. Rauch</name>
</region>
<name sortKey="Veron, M" sort="Veron, M" uniqKey="Veron M" first="M." last="Véron">M. Véron</name>
</country>
<country name="Allemagne"><region name="Berlin"><name sortKey="Kirmse, H" sort="Kirmse, H" uniqKey="Kirmse H" first="H." last="Kirmse">H. Kirmse</name>
</region>
<name sortKey="H Usler, I" sort="H Usler, I" uniqKey="H Usler I" first="I." last="H Usler">I. H Usler</name>
<name sortKey="Neumann, W" sort="Neumann, W" uniqKey="Neumann W" first="W." last="Neumann">W. Neumann</name>
</country>
<country name="Belgique"><region name="Région de Bruxelles-Capitale"><name sortKey="Bultreys, D" sort="Bultreys, D" uniqKey="Bultreys D" first="D." last="Bultreys">D. Bultreys</name>
</region>
<name sortKey="Maniette, Y" sort="Maniette, Y" uniqKey="Maniette Y" first="Y." last="Maniette">Y. Maniette</name>
<name sortKey="Nicolopoulos, S" sort="Nicolopoulos, S" uniqKey="Nicolopoulos S" first="S." last="Nicolopoulos">S. Nicolopoulos</name>
</country>
</tree>
</affiliations>
</record>
Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=$WICRI_ROOT/Wicri/Belgique/explor/OpenAccessBelV2/Data/Main/Exploration
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 000B63 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd -nk 000B63 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien |wiki= Wicri/Belgique |area= OpenAccessBelV2 |flux= Main |étape= Exploration |type= RBID |clé= ISTEX:9898D5EDC465E9D2785BDA6812B14B3C0C981E55 |texte= High spatial resolution semi‐automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes }}
This area was generated with Dilib version V0.6.25. |